CINECA IRIS Institutional Research Information System
IRIS è la soluzione IT che facilita la raccolta e la gestione dei dati relativi alle attività e ai prodotti della ricerca. Fornisce a ricercatori, amministratori e valutatori gli strumenti per monitorare i risultati della ricerca, aumentarne la visibilità e allocare in modo efficace le risorse disponibili.
EnglishBy using self-organized patterning of polycrystalline Au electrodes, we demonstrate that the electrical resistivity of the film can be forced to become strongly anisotropic by tailoring a nanoscale ripple undulation at the metal-vacuum interface. Electrons traveling orthogonally to the nanoripples are affected by a strong increase in resistivity, while when electrons travel parallel to the undulations of the rippled film, the resistivity is almost unaffected and even shows a slight reduction. The observations are quantitatively interpreted within the semiclassical size-effect regime in terms of an increase of surface scattering from the large-scale corrugations and of a reduction of diffuse scattering from atomic-scale roughness.
Scheda prodotto non validato
Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo
| Titolo: | Tailoring resisitivity anisotropy of nanorippled metal films: Electrons surfing on gold waves |
| Autori: | |
| Data di pubblicazione: | 2012 |
| Rivista: | |
| Abstract: | By using self-organized patterning of polycrystalline Au electrodes, we demonstrate that the electrical resistivity of the film can be forced to become strongly anisotropic by tailoring a nanoscale ripple undulation at the metal-vacuum interface. Electrons traveling orthogonally to the nanoripples are affected by a strong increase in resistivity, while when electrons travel parallel to the undulations of the rippled film, the resistivity is almost unaffected and even shows a slight reduction. The observations are quantitatively interpreted within the semiclassical size-effect regime in terms of an increase of surface scattering from the large-scale corrugations and of a reduction of diffuse scattering from atomic-scale roughness. |
| Handle: | http://hdl.handle.net/11567/389218 |
| Appare nelle tipologie: | 01.01 - Articolo su rivista |
File in questo prodotto:
http://hdl.handle.net/11567/389218
Copyright © 2020