In this paper we present results concerning the development of a lithographic technique suitable for application to Langmuir-Blodgett films. Controlled ablations of well-defined portions of the film have been made by using a scanning force microscope (SFM). We report the values of the microscope operational parameters that have allowed us either to perform non-destructive imaging or to obtain reproducible ablations of controlled depth. In particular, our analysis has pointed out the importance of the scanning speed in giving rise to such surface modifications. © 1997 by John Wiley & Sons, Ltd.
Controlled ablation of langmuir-blodgett films made by scanning force microscopy
Bonfiglio A.;Ricci D.;Parodi M. T.;Bianco B.
1997-01-01
Abstract
In this paper we present results concerning the development of a lithographic technique suitable for application to Langmuir-Blodgett films. Controlled ablations of well-defined portions of the film have been made by using a scanning force microscope (SFM). We report the values of the microscope operational parameters that have allowed us either to perform non-destructive imaging or to obtain reproducible ablations of controlled depth. In particular, our analysis has pointed out the importance of the scanning speed in giving rise to such surface modifications. © 1997 by John Wiley & Sons, Ltd.
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