Sensitivity of the amplitude and phase measurements in interferometric microscopy is influenced by factors such as instrument design and environmental interferences. Through development of a theoretical framework followed by experimental validation, we show photon shot noise is often the limiting factor in interferometric microscopy measurements. Thereafter, we demonstrate how a state-of-the-art camera with million-level electrons full well capacity can significantly reduce shot noise contribution resulting in a stability of optical path length down to a few picometers even in a near-common-path interferometer. (C) 2016 Optical Society of America
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Titolo: | Pushing phase and amplitude sensitivity limits in interferometric microscopy |
Autori: | |
Data di pubblicazione: | 2016 |
Rivista: | |
Citazione: | Pushing phase and amplitude sensitivity limits in interferometric microscopy / Hosseini, P; Zhou, R; Kim, Yh; Peres, C; Diaspro, A; Kuang, C; Yaqoob, Z; So, Pt.. - In: OPTICS LETTERS. - ISSN 0146-9592. - STAMPA. - 41(2016), pp. 1656-1659. |
Handle: | http://hdl.handle.net/11567/841702 |
Appare nelle tipologie: | 01.01 - Articolo su rivista |
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