A first order probabilistic logic is developed and presented in both intuitive and formal terms. It is shown how it can be successfully applied to the development of probabilistic representations for the main structures and scales involved in (one-dimensional) measurement. As a part of the current debate on the nature of probability in measurement, this result provides a way for overcoming the traditional opposition between Bayesian and orthodox statistics.
|Titolo:||A first-order probabilistic logic with application to measurement representations|
|Data di pubblicazione:||2016|
|Appare nelle tipologie:||01.01 - Articolo su rivista|