We measured the spatial resolution of a 300 μm thick 75 × 500 μm silicon pixel detector as a function of the track angle using a 120 GeV pion beam. We observed that 13% of tracks perpendicular to the detector give a signal on two neighboring pixels; this fraction increases to 50% at an angle of 15° w.r.t. the normal incidence direction. The average spatial resolution is 28.2 μm at 0° and 14.6 μm at 15°. The detector efficiency is not affected by the charge sharing between pixels. Our data agree with the predictions of a simple geometrical model describing the charge sharing in the region between pixels. This model can be the basis for a full simulation of the behaviour of a pixel detector.

Space resolution of a silicon pixel detector as a function of the track angle

BARBERIS, DARIO;BOZZO, MARCO;GAGLIARDI, GUIDO;SETTE, GIUSEPPE;
1997-01-01

Abstract

We measured the spatial resolution of a 300 μm thick 75 × 500 μm silicon pixel detector as a function of the track angle using a 120 GeV pion beam. We observed that 13% of tracks perpendicular to the detector give a signal on two neighboring pixels; this fraction increases to 50% at an angle of 15° w.r.t. the normal incidence direction. The average spatial resolution is 28.2 μm at 0° and 14.6 μm at 15°. The detector efficiency is not affected by the charge sharing between pixels. Our data agree with the predictions of a simple geometrical model describing the charge sharing in the region between pixels. This model can be the basis for a full simulation of the behaviour of a pixel detector.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11567/383561
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