The aim of this work was to offer a state-of-the-art critical survey for characterizing airborne nano- and microparticles by means of electron microscopy (EM) techniques and to highlight advantages and limits of different possible operation modes. Procedures of collection and sample preparation are revisited and improved to analyse airborne particles deposited on filtering membranes by using various sampling methods. Three kinds of electron microscopes are used to this end: scanning electron microscope (SEM), field emission scanning electron microscope (FE-SEM) and transmission electron microscope (TEM). Following and extending previous studies, we optimized procedures by varying both the sample collection/preparation and the operational parameters of the microscopes. In particular, we diversified the sampling methods applied, using ad hoc filters as well as common filters for standard gravimetric measures. This approach enabled us to achieve a simple and clean procedure allowing direct SEM or TEM observation of the collected particulate matter.
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|Titolo:||Electron microscopic characterization of airborne micro- and nanoparticulate matter|
|Data di pubblicazione:||2011|
|Appare nelle tipologie:||01.01 - Articolo su rivista|