The corrosion behaviour of Sn–3Ag–3Cu (at%) alloy was investigated in 0.1M NaCl solution by potentiodynamic polarization and impedance spectroscopy measurements and compared with that of the Sn–3Ag–0.5Cu (at%) solder employed in the packaging of some microelectronic components and devices. Scanning electron microscopy (SEM) and electron probe microanalysis (EPMA) were used to characterize the samples prior to and after the electrochemical tests. Results showed that in NaCl solution the corrosion resistance of the Sn–3Ag–3Cu alloy was better than that of the Sn–3Ag–0.5Cu solder. The presence of tin oxychlorides or oxyhydroxychlorides was detected at the surface of both alloys investigated after the electrochemical tests. The better corrosion behaviour of the Sn–3Ag–3Cu alloy compared to the Sn–3Ag–0.5Cu solder can be ascribed to a more adherent and compact corrosion products layer.

Electrochemical corrosion study of Sn-3Ag-3Cu solder alloy in NaCl solution

ZANICCHI, GILDA;CARLINI, RICCARDO;MARAZZA, RINALDO
2009-01-01

Abstract

The corrosion behaviour of Sn–3Ag–3Cu (at%) alloy was investigated in 0.1M NaCl solution by potentiodynamic polarization and impedance spectroscopy measurements and compared with that of the Sn–3Ag–0.5Cu (at%) solder employed in the packaging of some microelectronic components and devices. Scanning electron microscopy (SEM) and electron probe microanalysis (EPMA) were used to characterize the samples prior to and after the electrochemical tests. Results showed that in NaCl solution the corrosion resistance of the Sn–3Ag–3Cu alloy was better than that of the Sn–3Ag–0.5Cu solder. The presence of tin oxychlorides or oxyhydroxychlorides was detected at the surface of both alloys investigated after the electrochemical tests. The better corrosion behaviour of the Sn–3Ag–3Cu alloy compared to the Sn–3Ag–0.5Cu solder can be ascribed to a more adherent and compact corrosion products layer.
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11567/247213
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 87
  • ???jsp.display-item.citation.isi??? 82
social impact