In this paper an analytical solution of an elastic isotropic thin-film on an elastic substrate under an axisymmetric loading on the plane surface is presented. The analysis is intended to model the micronanoindentationtests to evaluate some of the relevant properties of thin films and provide information about the influence of interface conditions between the film and the substrate.

Elastic indentation problems in thin films on substrate systems

SBURLATI, ROBERTA
2006-01-01

Abstract

In this paper an analytical solution of an elastic isotropic thin-film on an elastic substrate under an axisymmetric loading on the plane surface is presented. The analysis is intended to model the micronanoindentationtests to evaluate some of the relevant properties of thin films and provide information about the influence of interface conditions between the film and the substrate.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11567/223598
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