A Measurement of Lorentz Angle and Spatial Resolution of Radiation Hard Silicon Pixel Sensors

Gorelov;G. Gorfine;M. Hoeferkamp;S. C. Seidel;A. Ciocio;K. Einsweiler;M. Gilchriese;A. Joshi;S. Kleinfelder;R. Marchesini;O. Milgrome;N. Palaio;F. Pengg;J. Richardson;G. Zizka;M. Acker;P. Fischer;M. Keil;S. Meuser;T. Stockmanns;J. Treis;N. Wermes;C. G. oling;F. H. ugging;J. W. ustenfeldd;. Wunstorfd;BARBERIS, DARIO;R. Beccherle;M. Cervetto;G. Darbo;GAGLIARDI, GUIDO;C. Gemme;P. Morettini;P. Netchaeva;OSCULATI, BIANCA MARIA;PARODI, FABRIZIO;L. Rossi;K. Dao;D. Fasching;L. Blanquart;P. Breugnon;D. Calvet;J. C. Clemens;P. Delpierre;G. Hallewell;D. Laugier;T. Mouthuy;A. Rozanov;C. Trouilleau;I. Valin;M. Aleppo;A. Andreazza;M. Caccia;T. Lari;C. Meroni;F. Ragusa;C. Troncon;G. Vegni;T. Rohe;G. R. Boyd;H. Severini;P. L. Skubic;J. Snow;P. Sı´chok;L. Tomasek;V. Vrba;M. Holder;D. Lipka;M. Ziolkowski;D. Cauz;S. D’Auria;C. del Papa;H. Grassman;L. Santi;K. H. Becks;P. Gerlach;C. Grahn;I. Gregor;T. Harenberg;C. Linder

2002-01-01