We report on the study of phonon polaritons modes in thin crystalline flakes of Bi2Se3 and Bi2(Te1-x Sex)3 as a function of the flake thickness, by means of two near-field THz techniques: phase resolved self-detection and THz time domain spectroscopy (TDS-SNOM). Background-free near-field imaging with nanoscale spatial resolution is demonstrated.

Near-field THz detection of phonon-polariton modes in thin flakes of topological insulator materials: Bi2Se3 and Bi(Te1-x Sex)3

Giordano M.;
2019-01-01

Abstract

We report on the study of phonon polaritons modes in thin crystalline flakes of Bi2Se3 and Bi2(Te1-x Sex)3 as a function of the flake thickness, by means of two near-field THz techniques: phase resolved self-detection and THz time domain spectroscopy (TDS-SNOM). Background-free near-field imaging with nanoscale spatial resolution is demonstrated.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11567/1005522
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