A novel scattering-type near-field optical microscopy (s-SNOM) system based on a terahertz (THz) quantum cascade laser operating in self-detection mode is employed to probe a resonant phonon-polariton mode of a thin topological insulator flake (Bi2Te2.2Se0.8). Background-free near-field imaging with nanoscale spatial resolution is demonstrated.
Phase-resolved terahertz near-field nanoscopy of a topological insulator phonon-polariton mode
Giordano M. C.;
2018-01-01
Abstract
A novel scattering-type near-field optical microscopy (s-SNOM) system based on a terahertz (THz) quantum cascade laser operating in self-detection mode is employed to probe a resonant phonon-polariton mode of a thin topological insulator flake (Bi2Te2.2Se0.8). Background-free near-field imaging with nanoscale spatial resolution is demonstrated.
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