Combining Fast Scanning Chip Calorimetry with Structural and Morphological Characterization Techniques

Thanks to the development of fast-scanning (chip-based) calorimeters (FSC) it is nowadays possible to achieve very high cooling rates, which enabled the study of polymer crystallization at large supercoolings, in conditions similar to what is experienced in real industrial processes. In such extreme conditions formation of structures very different from those commonly obtained under relatively slow cooling can occur. Albeit important, the information about thermal events gained by FSC might not be sufficient for a proper understanding of polymer structuring. In this chapter, new exciting developments on the coupling between FSC/fast cooling devices and structural or morphological probes are reported. For example, atomic force and polarized optical microscopy can be applied ex situ to polymer samples which have been submitted to a chosen FSC thermal protocol. Moreover, ballasting cooling and FSC-based devices have been realized, to allow fast Wide Angle X-ray Diffraction measurements at synchrotron facilities. Some recent examples of real-time detection of polymer structuring during fast cooling are presented.