A new shape descriptor based on Statistical Morphology is presented. The descriptor, called specstrum, is a statistical extension of pattern spectrum, (i.e., pecstrum) useful to represent shape information related to binary patterns in noisy conditions. The major features of the specstrum are an increased stability under varying noisy conditions and a more regular shape description capability. Results are presented for a parking surveillance application.

Statistical pattern spectrum for binary pattern recognition

Carlo S Regazzoni;
1994-01-01

Abstract

A new shape descriptor based on Statistical Morphology is presented. The descriptor, called specstrum, is a statistical extension of pattern spectrum, (i.e., pecstrum) useful to represent shape information related to binary patterns in noisy conditions. The major features of the specstrum are an increased stability under varying noisy conditions and a more regular shape description capability. Results are presented for a parking surveillance application.
1994
978-94-010-4453-0
978-94-011-1040-2
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11567/1104993
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