CELASCO, EDVIGE
CELASCO, EDVIGE
100020 - Dipartimento di Fisica
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Chemical reactivity and variation in electronical properties of graphene on Ni(111) and reduced graphene oxide
2019-01-01 Celasco, E.
Defect influence on the electrical properties of 4H-SiC Schottky diodes
2004-01-01 Scaltrito, L.; Celasco, Edvige; Porro, S.; Ferrero, S.; Giorgis, F.; Pirri, C. F.; Perrone, D.; Meotto, U.; Mandracci, P.; Richieri, G.; Merlin, L.; Cavallini, A.; Castaldini, A.; Rossi, M.
X-Ray Analysis on Ceramic Materials Deposited by Sputtering and Reactive Sputtering for Sensing Applications
2012-01-01 Gazia, Rossana; Chiodoni, Angelica; Celasco, Edvige; Bianco, Stefano; Mandracci, Pietro
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Chemical reactivity and variation in electronical properties of graphene on Ni(111) and reduced graphene oxide | 1-gen-2019 | Celasco, E. | |
Defect influence on the electrical properties of 4H-SiC Schottky diodes | 1-gen-2004 | Scaltrito, L.; Celasco, Edvige; Porro, S.; Ferrero, S.; Giorgis, F.; Pirri, C. F.; Perrone, D.; Meotto, U.; Mandracci, P.; Richieri, G.; Merlin, L.; Cavallini, A.; Castaldini, A.; Rossi, M. | |
X-Ray Analysis on Ceramic Materials Deposited by Sputtering and Reactive Sputtering for Sensing Applications | 1-gen-2012 | Gazia, Rossana; Chiodoni, Angelica; Celasco, Edvige; Bianco, Stefano; Mandracci, Pietro |