Thin oxide films have physical and chemical properties which may be significantly different from those of the corresponding bulk materials. For their complete characterization the information on the lattice dynamics which can be retrieved by vibrational spectroscopy is mandatory. Here we show that the number of observed phonon modes and their frequencies can indeed provide relevant information about stoichiometry, structure and thickness of the film.
|Titolo:||Phonons in Thin Oxide Films|
|Data di pubblicazione:||2016|
|Appare nelle tipologie:||02.01 - Contributo in volume (Capitolo o saggio)|