Helium atom scattering (HAS) is a well established technique, particularly suited for the investigation of insulating and/or fragile materials and light adsorbates including hydrogen. In contrast to other beam techniques based on Xrays or electrons, low energy (typically less than 100 meV) He atoms are scattered by the tail of the electron density distribution which spill out from a surface, therefore HAS is strictly a nonpenetrating technique without any sample damage. HAS has been used to investigate structural properties of crystalline surfaces, including precise determination of atomic step heights, for monitoring thin film growth, to study surface transitions such as surface melting and roughening and for determining the presence and properties of adsorbates. Energy resolved HAS can provide information about surface vibrations (phonons) in the meV range and surface diffusion. This chapter provides a brief introduction to HAS with an outlook on a new, promising surface science technique: Neutral Helium Microscopy.

Probing surfaces with thermal He atoms: scattering and microscopy with a soft touch

BRACCO, GIANANGELO
2013

Abstract

Helium atom scattering (HAS) is a well established technique, particularly suited for the investigation of insulating and/or fragile materials and light adsorbates including hydrogen. In contrast to other beam techniques based on Xrays or electrons, low energy (typically less than 100 meV) He atoms are scattered by the tail of the electron density distribution which spill out from a surface, therefore HAS is strictly a nonpenetrating technique without any sample damage. HAS has been used to investigate structural properties of crystalline surfaces, including precise determination of atomic step heights, for monitoring thin film growth, to study surface transitions such as surface melting and roughening and for determining the presence and properties of adsorbates. Energy resolved HAS can provide information about surface vibrations (phonons) in the meV range and surface diffusion. This chapter provides a brief introduction to HAS with an outlook on a new, promising surface science technique: Neutral Helium Microscopy.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11567/504149
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