Energy dissipation in amorphous coatings severely affects high-precision optical and quantum transducers. In order to isolate the source of coating loss, we performed an extensive study of Raman scattering and mechanical loss of a thermally treated sputtered silica coating. Our results show that loss is correlated with the population of three-membered rings of Si-O-4 tetrahedral units and support the evidence that thermal treatment reduces the density of metastable states separated by a characteristic energy of about 0.5 eV in favor of an increase of the density of states separated by smaller activation energies.
Titolo: | Correlated evolution of structure and mechanical loss of a sputtered silica film |
Autori: | |
Data di pubblicazione: | 2018 |
Rivista: | |
Handle: | http://hdl.handle.net/11567/920225 |
Appare nelle tipologie: | 01.01 - Articolo su rivista |
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