Impact of background noise on dielectric reconstructions obtained by a prototype of microwave axial tomograph

This paper investigates the influence of noise on a microwave axial tomograph developed by some of the authors for the inspection of dielectric objects. In particular, the impact of the measurement environment is considered and the images obtained from data measured in a controlled and an uncontrolled environment are presented and compared. Moreover, the effects of interference signals are considered. Accordingly, several experimental results are reported and discussed in terms of proper error parameters.