New steps toward the development of a microwave axial tomomograph for inspecting dielectric materials are reported in this paper. The design of the proposed imaging system is described and the results of preliminary forward scattering simulations are reported in order to define the requirements for an efficient treatment of the measured scattered data.

A microwave axial tomograph: Experimental set up and reconstruction procedure

PASTORINO, MATTEO;RANDAZZO, ANDREA
2006-01-01

Abstract

New steps toward the development of a microwave axial tomomograph for inspecting dielectric materials are reported in this paper. The design of the proposed imaging system is described and the results of preliminary forward scattering simulations are reported in order to define the requirements for an efficient treatment of the measured scattered data.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11567/239170
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