In this paper, the development of a microwave axial tomograph for the inspection of dielectric materials is discussed In particular, hardware and software solutions are pointed out. An experimental bistatic imaging set up is described. Moreover, the results of several forward scattering simulations, aimed at defining suitable operation conditions, are reported. Finally, in order to evaluate a possible inverse-scattering based reconstruction procedure, the results of a preliminary inversion is reported.
A new microwave axial tomograph for the inspection of dielectric materials
PASTORINO, MATTEO;RANDAZZO, ANDREA
2006-01-01
Abstract
In this paper, the development of a microwave axial tomograph for the inspection of dielectric materials is discussed In particular, hardware and software solutions are pointed out. An experimental bistatic imaging set up is described. Moreover, the results of several forward scattering simulations, aimed at defining suitable operation conditions, are reported. Finally, in order to evaluate a possible inverse-scattering based reconstruction procedure, the results of a preliminary inversion is reported.
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